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Metrological applications of X-ray interferometry.

Yacoot, A (2005) Metrological applications of X-ray interferometry. In: Nanscale calibration standards and methods: dimensional and related measurements in the micro- and nanometer range. Wiley-VCH. ISBN 352740502X

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Abstract

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Item Type: Book Chapter/Section
Subjects: Nanoscience
Nanoscience > Nano-Dimensional
Publisher: Wiley-VCH
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3582

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