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Repeatability intensity calibration of an x-ray photoelectron spectrometer.

Seah, M P; Spencer, S J (2006) Repeatability intensity calibration of an x-ray photoelectron spectrometer. J. Electron Spectrosc. Relat. Phenom., 151. pp. 178-181.

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Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3531

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