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Microelectromechanical systems device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m.

Cumpson, P J; Hedley, J*; Clifford, C A; Chen, X*; Allen, S* (2004) Microelectromechanical systems device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m. J. Vac. Sci. Technol. A, 22 (4). pp. 1444-1449.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3387

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