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Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance.

Cumpson, P J; Hedley, J*; Clifford, C A (2005) Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance. J. Vac. Sci. Technol. B, 23 (5). pp. 1992-1997.

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Abstract

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Item Type: Article
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3385

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