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Recent advances in traceable nanoscale dimension and force metrology in the UK.

Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2005) Recent advances in traceable nanoscale dimension and force metrology in the UK. In: ISMTII 2005 - 7th International Symposium Series on Measurement Technology and Intelligent Instruments., 6-8 September 2005, Huddersfield, UK.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Nanoscience
Nanoscience > Nano-Dimensional
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3297

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