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Metrology at the nano scale.

Sheridan, B; Cumpson, P J; Bailey, M J A (2005) Metrology at the nano scale. Phys. World, 18 (8). pp. 37-40.

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Abstract

No abstract available

Item Type: Article
Subjects: Nanoscience
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3246

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