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Characterisation of a new vertical scanning white light interferometer - a test case?

Leach, R K; Bennett, I* (2004) Characterisation of a new vertical scanning white light interferometer - a test case? In: 11th International Colloquium on Surfaces, 2-3 February 2004, Chemnitz, Germany.

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Abstract

No abstract available

Item Type: Conference or Workshop Item (UNSPECIFIED)
Keywords: surface topography, surface texture
Subjects: Engineering Measurements
Engineering Measurements > Dimensional
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/2883

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