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VAMAS 2002: Static ToF SIMS inter-laboratory study - protocol for analysis.

Gilmore, I S; Seah, M P (2001) VAMAS 2002: Static ToF SIMS inter-laboratory study - protocol for analysis. NPL Report. COAM 6

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Abstract

This report describes the protocol for analysis in the VAMAS 2002, static ToF SIMS inter-laboratory study. Procedures for setting the primary ion beam, mass analyser, ion detector and charge compensation are provided to ensure the equivalence of data between different instruments and analyser types. Three reference materials are supplied for this study, polycarbonate on silicon, a thin layer of polystyrene oligomers on silver and bulk PTFE. No sample preparation is required by the user and specific guidance is given on sample handling. Forms for reporting the data are provided in Appendix B together with the preferred data media and format.

Item Type: Report/Guide (NPL Report)
NPL Report No.: COAM 6
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/2203

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