Leach, R K (2001) A recent comparison of stylus and optical methods for measuring surface texture. In: 9th IMEKO Symposium Metrology for Quality Control in Production; Surface Metrology for Quality Assurance., 24-27 September 2001, Cairo, Egypt.

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Abstract

Due to the demanding dimensional specifications required by modern precision products a large number of instruments and methods have been developed to establish an appropriate metrology infrastructure. When measuring surface texture (Profile, waviness and roughness), the form of the test object is removed, either by some type of mechanical skid device or by digital filtering techniques. Increasingly, engineering surfaces are measured using non-contact optical probing techniques for which there are no international specification standards. This lack of specification standards and other issues of calibration, along with the multitude of transducers available, mean that it is difficult to obtain traceability to the definition of the metre. This paper presents the results of a comparison of optical and stylus instruments.

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Last Modified:	02 Feb 2018 13:17
URI:	http://eprintspublications.npl.co.uk/id/eprint/2153

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