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Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV.

Leach, R K (2000) Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV. Meas. Sci. Technol., 11. pp. 1162-1173.

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Abstract

No abstract available

Item Type: Article
Keywords: surface texture measurement, traceability, interferometry
Subjects: Nanoscience
Nanoscience > Nano-Dimensional
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/1917

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