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NanoSurf IV: Traceable measurement of surface texture.

Leach, R K (2000) NanoSurf IV: Traceable measurement of surface texture. In: Xth International Conference on Surfaces., Jan 2000, Chemnitz, Germany.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Nanoscience
Nanoscience > Nano-Dimensional
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/1911

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