< back to main site

Publications

Advances in traceable nanometrology at the National Physical Laboratory.

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2000) Advances in traceable nanometrology at the National Physical Laboratory. In: Proc. Int. Seminar Future Directions of Nanotechnology in Europe and Japan., 18-19 September 2000, Warwick University.

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Nanoscience
Nanoscience > Nano-Dimensional
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/1784

Actions (login required)

View Item View Item