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The use of x-ray interferometry to investigate the linearity of the NPL differential plane mirror optical interferometer.

Yacoot, A; Downs, M J (2000) The use of x-ray interferometry to investigate the linearity of the NPL differential plane mirror optical interferometer. Meas. Sci. Technol., 11. pp. 1126-1130.

Full text not available from this repository.
Item Type: Article
Keywords: x-ray interferometer, differential optical interferometry, laser stability, fringe interpolation, sub-nanometric accuracy
Subjects: Engineering Measurements
Engineering Measurements > Dimensional
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/1624

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