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The verification of a high precision two dimensional position measurement system.

Downs, M J; Forbes, A B; Siddle, J E (1998) The verification of a high precision two dimensional position measurement system. In: Applied Optics and Optoelectronics 1998, 16-19 March 1998, Brighton, UK.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Engineering Measurements
Engineering Measurements > Dimensional
Last Modified: 02 Feb 2018 13:18
URI: http://eprintspublications.npl.co.uk/id/eprint/1541

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