Downs, M J; Forbes, A B; Siddle, J E (1998) The verification of a high precision two dimensional position measurement system. In: Applied Optics and Optoelectronics 1998, 16-19 March 1998, Brighton, UK.

Full text not available from this repository.

Abstract

No abstract available

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Last Modified:	02 Feb 2018 13:18
URI:	http://eprintspublications.npl.co.uk/id/eprint/1541

Actions (login required)

View Item