Downs, M J; Forbes, A B; Siddle, J E (1998) The verification of a high precision two dimensional position measurement system. In: Applied Optics and Optoelectronics 1998, 16-19 March 1998, Brighton, UK.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Engineering Measurements Engineering Measurements > Dimensional |
Last Modified: | 02 Feb 2018 13:18 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/1541 |
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