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Depth sensing indentation of thin hard films: a study of modulus measurement sensitivity to indentation parameters.

Jennett, N M; Meneve, J* (1998) Depth sensing indentation of thin hard films: a study of modulus measurement sensitivity to indentation parameters. In: Fundamentals of Nanodentation and Nanotribology Symposium, 13-17 April 1998, San Francisco, USA.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Nanoscience
Nanoscience > Nano-Materials
Last Modified: 02 Feb 2018 13:18
URI: http://eprintspublications.npl.co.uk/id/eprint/1407

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